Oxygen depth profiling in prepared by sol-gel method using 16O(α, α)16O resonant backscattering-Reference-Cited by-同舟云学术

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Oxygen depth profiling in prepared by sol-gel method using 16O(α, α)16O resonant backscattering

Published:1998-03 Issue: Volume:136-138 Page:557-562
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Miyagawa Y.,Saitoh K.,Nakao S.,Nonami T.,Kato K.,Taoda H.,Miyagawa S.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Depth profiling with narrow resonances of nuclear reactions: Theory and experimental use

2. Conventional depth profiling using narrow nuclear resonances

3. Methodology and application of the nuclear resonance reaction 16O(α, α)16O for the profiling of titanium oxide

4. Oxygen depth profiling study of copper oxide films on silicon (100) substrates by 16O(α,α)16O resonance

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-energy metal ion implantation into titanium dioxide films;Surface and Coatings Technology;2000-06

2. Effects of ion beam mixing on the depth profiles of thin metal layer in TiO2;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-05

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