Author:
Watamori Michio,Oura Kenjiro,Nakamura Takao
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
2 articles.
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1. High-energy ion beam analysis of ferroelectric thin films;Applied Surface Science;1997-06
2. Channeling analysis of oxygen in oxide materials using 16O(α, α)16O resonant backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09