Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors-Reference-Cited by-同舟云学术

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Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors

Published:2012 Issue:5 Volume:15 Page:H161
ISSN:1099-0062
Container-title:Electrochemical and Solid-State Letters
language:en
Short-container-title:Electrochem. Solid-State Lett.

Author:

Huang Sheng-Yao,Chang Ting-Chang,Chen Min-Chen,Chen Shih-Cheng,Chen Te-Chih,Jian Fu-Yen

Publisher

The Electrochemical Society

Subject

Electrical and Electronic Engineering,Electrochemistry,Physical and Theoretical Chemistry,General Materials Science,General Chemical Engineering

Reference20 articles.

1. A low-temperature method for improving the performance of sputter-deposited ZnO thin-film transistors with supercritical fluid

2. Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

3. Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

4. Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

5. Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hot Carrier Effect in Self-Aligned In–Ga–Zn–O Thin-Film Transistors With Short Channel Length;IEEE Transactions on Electron Devices;2020-12

2. Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors;Nanomaterials;2020-06-18

3. Effects of gas environment on electronic and optical properties of amorphous indium zinc tin oxide thin films;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2013-05

4. Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors;Applied Physics Letters;2012-12-17

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