Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors-Reference-Cited by-同舟云学术

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Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors

Published:2012-12-17 Issue:25 Volume:101 Page:253502
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Huang Sheng-Yao,Chang Ting-Chang,Yang Man-Chun,Lin Li-Wei,Wu Ming-hsin,Yang Kai-Hsiang,Chen Min-Chen,Chiu Yi-Jen,Yeh Bo-Liang

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4772485

Reference13 articles.

1. Temperature Dependence of Transistor Characteristics and Electronic Structure for Amorphous In–Ga–Zn-Oxide Thin Film Transistor

2. Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

3. H2O-Assisted O2 Adsorption in Sol-Gel Derived Amorphous Indium Gallium Zinc Oxide Thin Film Transistors

4. Development of IGZO TFTs and their applications to next‐generation flat‐panel displays

5. Driving Schemes for a-Si and LTPS AMOLED Displays

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1. Etch-stop layer plasma chemical enhanced vapor deposition for oxide thin-film-transistor;Chinese Journal of Liquid Crystals and Displays;2019

2. Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors;Chinese Physics B;2019-01

3. Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs;IEEE Transactions on Electron Devices;2017-08

4. Skin-Like Oxide Thin-Film Transistors for Transparent Displays;Advanced Functional Materials;2016-07-04

5. Self-heating induced instability of oxide thin film transistors under dynamic stress;Applied Physics Letters;2016-01-11

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