Fourier transform refractometry
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Publisher
SPIE
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs;Physical Review Research;2023-07-25
2. High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures;2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC);2023-06-26
3. High-Accuracy Measurement of Mid-IR Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures;CLEO 2023;2023
4. High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers;Optical Interference Coatings Conference (OIC) 2022;2022
5. High accuracy refractive index measurement system for germanium and silicon using the channelled spectrum method in the range of 3 to 15 μm;SPIE Proceedings;2016-05-18
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