High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures-Reference-Cited by-同舟云学术

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High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

Published:2023-06-26 Issue: Volume: Page:
ISSN:
Container-title:2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
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Author:

Perner Lukas W.¹,Truong Gar-Wing²,Follman David²,Prinz Maximilian¹,Winkler Georg¹,Puchegger Stephan³,Cole Garrett D.²,Heckl Oliver H.¹

Affiliation:

1. University of Vienna,Christian Doppler Laboratory for Mid-IR Spectroscopy and Semiconductor Optics, Faculty of Physics, Faculty Center for Nano Structure Research,Vienna,Austria,1090

2. Thorlabs Crystalline Solutions,Santa Barbara,CA,USA,93101

3. University of Vienna,Faculty of Physics, Faculty Center for Nano Structure Research,Vienna,Austria,1090

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10231377/10231353/10232458.pdf?arnumber=10232458

Reference6 articles.

1. Precise Measurement of Refractive Indices in Thin Film Heterostructures;perner;arXiv 2301 07712,2023

2. Transmission-dominated mid-infrared supermirrors with finesse exceeding 200 000;truong;arXiv 2209 09902,2022

3. Improved dispersion relations for GaAs and applications to nonlinear optics

4. Simultaneously-Measured Mid-Infrared Refractive Indices of GaAs/AlGaAs;perner;arXiv 2301 08293,2023

5. Refractive index of Ga1−xAlxAs

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