Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs-Reference-Cited by-同舟云学术

Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs

Published:2023-07-25 Issue:3 Volume:5 Page:
ISSN:2643-1564
Container-title:Physical Review Research
language:en
Short-container-title:Phys. Rev. Research

Author:

Perner Lukas W.^ORCID,Truong Gar-Wing^ORCID,Follman David,Prinz Maximilian^ORCID,Winkler Georg,Puchegger Stephan,Cole Garrett D.^ORCID,Heckl Oliver H.^ORCID

Funder

Universität Wien

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevResearch.5.033048/fulltext

Reference40 articles.

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4. Development of mid-wavelength and long-wavelength megapixel portable QWIP imaging cameras

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