Physical mechanisms of negative-bias temperature instability
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1897075
Reference31 articles.
1. Mechanism of negative‐bias‐temperature instability
2. Wide band gap ferromagnetic semiconductors and oxides
3. Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices
4. Generalized diffusion-reaction model for the low-field charge-buildup instability at the Si-SiO2interface
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