Kinetics of Si1−xGex(001) growth on Si(001)2×1 by gas-source molecular-beam epitaxy from Si2H6 and Ge2H6
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368882
Reference44 articles.
1. Prospects of SiGe heterodevices
2. High-performance Si/SiGe n-type modulation-doped transistors
3. Physics and applications of GexSi1-x/Si strained-layer heterostructures
4. Mechanisms and kinetics of Si atomic‐layer epitaxy on Si(001)2×1 from Si2H6
5. Si(001)2×1 gas‐source molecular‐beam epitaxy from Si2H6: Growth kinetics and boron doping
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2. Ultra-low temperature (≤300 °C) growth of Ge-rich SiGe by solid-liquid-coexisting annealing of a-GeSn/c-Si structures;Journal of Applied Physics;2015-09-07
3. Heteroepitaxial Growth of Si, Si1−xGex-, and Ge-Based Alloy;Handbook of Crystal Growth;2015
4. Digermane Deposition on Si(100) and Ge(100): from Adsorption Mechanism to Epitaxial Growth;The Journal of Physical Chemistry C;2013-12-24
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