Mechanisms for retention loss in ferroelectric Pt/Pb(Zr0.4Ti0.6)O3/Pt capacitors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1563833
Reference12 articles.
1. Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features
2. Lanthanum-substituted bismuth titanate for use in non-volatile memories
3. Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi4Ti3O12 thin films
4. The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence
5. Thermally induced voltage offsets in Pb(Zr,Ti)O3 thin films
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