Single frequency vertical piezoresponse force microscopy-Reference-Cited by-同舟云学术

Single frequency vertical piezoresponse force microscopy

Published:2021-02-07 Issue:5 Volume:129 Page:051101
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Hong Seungbum¹²^ORCID

Affiliation:

1. Materials Imaging and Integration Laboratory, Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Republic of Korea

2. KAIST Institute for NanoCentury (KINC), KAIST, Daejeon 34141, Republic of Korea

Funder

National Research Foundation of Korea

KAIST

Ministry of Trade, Industry and Energy

Samsung

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0038744

Reference139 articles.

1. S. Hong, in Nanoscale Phenomena in Ferroelectric Thin Films, edited by S. Hong (Springer US, Boston, MA, 2004), p. 111.

2. Ferroelectric thin films: Review of materials, properties, and applications

3. IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY

4. Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

5. A. L. Kholkin, S. V. Kalinin, A. Roelofs, and A. Gruverman, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, edited by S. Kalinin and A. Gruverman (Springer New York, New York, NY, 2007), p. 173.

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy;Advanced Functional Materials;2024-09-02

2. Lateral Piezoelectricity of Alzheimer's Aβ Aggregates;Advanced Science;2024-08-19

3. Magnetic-Dielectric Cantilevers for Atomic Force Microscopy;Nanomaterials;2024-05-17

4. Li Doping‐Mediated Ultrahigh Current Generation from Flexible 2D MoS₂ Nanosheets‐Based Nanogenerators;Energy Technology;2024-04-18

5. Effect of Annealing Temperature on Minimum Domain Size of Ferroelectric Hafnia;ACS Applied Electronic Materials;2024-03-22