Topographic contrast of monatomic surface steps on Si(100) in secondary electron microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.350350
Reference17 articles.
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2. Observation of surface diffusion by biassed secondary electron imaging: The case of Ag/W(110)
3. Visualization of submonolayers and surface topography by biassed secondary electron imaging: Application to Ag layers on Si and W surfaces
4. High spatial resolution surface potential measurements using secondary electrons
5. Scanning electron microscopy with polarization analysis (SEMPA)
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4. Structural and Magnetic Properties of Epitaxially Grown Fcc Fe/Cu(100) and Fe/CaF2/Si(111);MRS Proceedings;1994
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