Author:
Scheinfein M.R.,Healy S.D.,Heim K.R.,Yang Z.J.,Drucker J.S.,Hembree G.G.
Abstract
ABSTRACTWe have used nanometer spatial resolution secondary electron and Auger electron imaging in an ultra-high vacuum scanning transmission electron microscope to characterize microstructure in ultrathin films of Fe/Cu(100) grown at room temperature and Fe/CaF2/Si(111) grown at room temperature and 150 C. Thin film microstructure was correlated in situ with magnetic properties by using the surface magneto-optic Kerr effect.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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