High spatial resolution surface potential measurements using secondary electrons
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference21 articles.
1. Continuous measurement of surface potential variations during oxygen adsorption on the (100), (110) and (111) faces of niobium using mirror electron microscope
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5. Potential profiling across semiconductor junctions by Auger electron spectroscopy in the scanning electron microscope
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