Calculation of changes in pattern dimensions to compensate for proximity effects in electron lithography
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.327329
Reference9 articles.
1. Computer-controlled scanning electron microscope system for high-resolution microelectronic pattern fabrication
2. Energy dissipation in a thin polymer film by electron beam scattering
3. Proximity effect in electron‐beam lithography
4. Self‐consistent proximity effect correction technique for resist exposure (SPECTRE)
5. Control of pattern dimensions in electron lithography
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Nanoscale fabrication by intrinsic suppression of proximity-electron exposures and general considerations for easy and effective top–down fabrication;Journal of Micromechanics and Microengineering;2010-11-12
2. Implementation of E-Beam Proximity Effect Correction using linear programming techniques for the fabrication of asymmetric bow-tie antennas;Solid-State Electronics;2010-10
3. A flexible and efficient approach to E-beam proximity effect correction—PYRAMID;Surface and Interface Analysis;2005
4. Dose, shape, and hybrid modifications for PYRAMID in electron beam proximity effect correction;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1997-11
5. Proximity effect correction in electron-beam lithography: A hierarchical rule-based scheme—PYRAMID;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1991-11
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3