Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging-Reference-Cited by-同舟云学术

Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging

Published:2014-01-21 Issue:3 Volume:115 Page:033113
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Schulz T.,Duff A.,Remmele T.,Korytov M.,Markurt T.,Albrecht M.,Lymperakis L.,Neugebauer J.,Chèze C.,Skierbiszewski C.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4862736

Reference16 articles.

1. Investigation of the In composition in InGaN/GaN quantum wells deposited by MOVPE and/or MBE with emission from violet to green

2. Time, energy, and spatially resolved TEM investigations of defects in InGaN

3. A quantitative procedure to probe for compositional inhomogeneities in InxGa1−xN alloys

4. Composition Fluctuations in InGaN Analyzed by Transmission Electron Microscopy

5. Quantitative analysis of interfacial strain in InAs/GaSb superlattices by aberration-corrected HRTEM and HAADF-STEM

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