A quantitative procedure to probe for compositional inhomogeneities in InxGa1−xN alloys
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference36 articles.
1. Introduction to Nitride Semiconductor Blue Laser and Light Emitting Diodes;Nakamura,2000
2. Quantitative measurement of displacement and strain fields from HREM micrographs
3. Strained state of Ge(Si) islands on Si: Finite element calculations and comparison to convergent beam electron‐diffraction measurements
4. Composition evaluation by lattice fringe analysis
5. Atomic Scale Indium Distribution in aGaN/In0.43Ga0.57N/Al0.1Ga0.9NQuantum Well Structure
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