Time, energy, and spatially resolved TEM investigations of defects in InGaN
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference17 articles.
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1. On the chemical homogeneity of InxGa1−xN alloys – Electron microscopy at the edge of technical limits;Materials Science in Semiconductor Processing;2017-07
2. Nanoscopy of Phase Separation in InxGa1–xN Alloys;ACS Applied Materials & Interfaces;2016-08-26
3. Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging;Journal of Applied Physics;2014-01-21
4. Optimization of the preparation of GaN-based specimens with low-energy ion milling for (S)TEM;Micron;2012-08
5. Effects of stress on phase separation in InxGa1−xN/GaN multiple quantum-wells;Acta Materialia;2011-06
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