Author:
Li Wei,Tan Cher Ming,Hou Yuejin
Subject
General Physics and Astronomy
Cited by
17 articles.
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1. Multi-physics Simulations for Nanoscale CMOS Reliability;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27
2. Phase-field simulations of electromigration-induced defects in interconnects with non-columnar grain microstructure;Journal of Applied Physics;2020-05-07
3. Concluding Remarks;Electromigration Modeling at Circuit Layout Level;2013
4. 3D Circuit Model Construction and Simulation;Electromigration Modeling at Circuit Layout Level;2013
5. Introduction;Electromigration Modeling at Circuit Layout Level;2013