Soft breakdown fluctuation events in ultrathin SiO2 layers
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.121910
Reference13 articles.
1. Soft breakdown of ultra-thin gate oxide layers
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3. Defect dynamics and wear-out in thin silicon oxides
4. Model based on trap-assisted tunneling for two-level current fluctuations in submicrometer metal–silicon-dioxide–silicon diodes
5. High-field-induced degradation in ultra-thin SiO/sub 2/ films
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