The effects of water on oxide and interface trapped charge generation in thermal SiO2films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.329502
Reference21 articles.
1. Photoemission of Electrons from Silicon into Silicon Dioxide
2. Electrochemical Charging of Thermal SiO2 Films by Injected Electron Currents
3. Avalanche Injection of Electrons into Insulating SiO2 Using MOS Structures
4. AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2
5. The Effects of Processing on Hot Electron Trapping in SiO2
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