Avalanche Injection of Electrons into Insulating SiO2 Using MOS Structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1659364
Reference7 articles.
1. Avalanche injection currents and trapping phenomena in thermal SiO2
2. AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2
3. HOT ELECTRON EMISSION FROM SILICON INTO SILICON DIOXIDE BY SURFACE AVALANCHE
4. THE INTRODUCTION OF CHARGE IN SiO2AND THE INCREASE OF INTERFACE STATES DURING BREAKDOWN OF EMITTER‐BASE JUNCTION OF GATED TRANSISTORS
5. MOS Avalanche and Tunneling Effects in Silicon Surfaces
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