HOT ELECTRON EMISSION FROM SILICON INTO SILICON DIOXIDE BY SURFACE AVALANCHE
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1652861
Reference5 articles.
1. MOS Avalanche and Tunneling Effects in Silicon Surfaces
2. Avalanche injection currents and trapping phenomena in thermal SiO2
3. Hot-Electron Emission From Shallowp−nJunctions is Silicon
4. Photoemission of Electrons from Silicon into Silicon Dioxide
5. Barrier energies in metal-silicon dioxide-silicon structures
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1. Photon emission from metal‐oxide‐semiconductor capacitors under fast‐ramp conditions;Journal of Applied Physics;1989-12
2. Dynamic current oscillations in a metal‐oxide‐semiconductor surface potential well;Journal of Applied Physics;1989-01-15
3. Characterization of metal‐oxide‐semiconductor capacitors with a fast‐ramp technique;Journal of Applied Physics;1988-06
4. Hot-electron emission from silicon into silicon dioxide;Solid-State Electronics;1978-01
5. Thin Film Applications in Microelectronics;Physics of Nonmetallic Thin Films;1976
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