Electrochemical Charging of Thermal SiO2 Films by Injected Electron Currents
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1659996
Reference27 articles.
1. AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2
2. Avalanche degradation of hFE
3. THE INTRODUCTION OF CHARGE IN SiO2AND THE INCREASE OF INTERFACE STATES DURING BREAKDOWN OF EMITTER‐BASE JUNCTION OF GATED TRANSISTORS
4. Avalanche Injection of Electrons into Insulating SiO2 Using MOS Structures
5. Improved Properties of Silicon Dioxide Layers Grown Under Bias
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