Atomic force microscope tip deconvolution using calibration arrays
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145549
Reference13 articles.
1. Tip artefacts in scanning force microscopy
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4. Can atomic force microscopy tips be inspected by atomic force microscopy?
5. Probe characterization for scanning probe metrology
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