Tip artefacts in scanning force microscopy
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1994.tb03441.x/fullpdf
Reference63 articles.
1. New scanning tunneling microscopy tip for measuring surface topography;Akama;J. Vac. Sci. Technol. A,1990
2. Improved atomic force microscope images using microcantilevers with sharp tips;Akamine;Appl. Phys. Lett.,1990
3. Atomic resolution imaging of a nonconductor by atomic force microscopy;Albrecht;J. Appl. Phys.,1987
4. Microfabrication of cantilever styli for the atomic force microscope;Albrecht;J. Vac. Sci. Technol. A,1990
5. Tip-induced artefacts in AFM images of protamine-complexed DNA fibers;Allen;Ultramicroscopy,1992
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