Interface roughness of short‐period AlAs/GaAs superlattices studied by spectroscopic ellipsometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.353972
Reference20 articles.
1. Interband transitions of thin-layer GaAs/AlAs superlattices
2. Interband Transitions in Ultrathin GaAs-AlAs Superlattices
3. Measurement of superlattice optical properties by variable angle spectroscopic ellipsometry
4. Optical constants of (GaAs)N(AlAs)N [N = 2−220] superlattices
5. Interface sharpness in low-order III–V superlattices
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