1. Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures
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3. P. G. Snyder, J. E. Oh, J. A. Woollam, Applied Physics Letters, to be published.
4. J. A. Woollam, P. G. Snyder, A. W. McCormick, A. K. Rai, D. C. Ingram, P. P. Pronko, J. J. Geddes, Materials Research Society Symposium Proceedings 77, to be published.