1. A.C. Boccara, C. Pickering, and J. Rivory, eds., Proc. 1st Int. Conf. on Spectroscopic Ellipsometry, Thin Solid Films, 233 (1993).
2. C. Pickering, “In-Situ Optical Studies of Epitaxial Growth,” Handbook of Crystal Growth, vol. 3., ed. D.T.J. Hurle (Amster-dam, the Netherlands: Elsevier, 1994), pp. 817–878.
3. R.N.A. Azzam and N.M. Bashara, Ellipsometry and Polarized Light (Amsterdam, the Netherlands: North-Holland, 1977).
4. C. Pickering, “Ellipsometry and Light Scattering Characterization of Semiconductor Surfaces,” Electromagnetic Waves: Recent Developments in Research, vol. 2 ed. P. Halevi (Amsterdam, the Netherlands: Elsevier, to be published).
5. D.E. Aspnes, J.B. Theeten, and F. Hottier, “Investigation of Effective-Medium Models of Microscopic Surface Roughness by Spectroscopic Ellipsometry,” Phys. Rev. B, 20 (1979), pp. 3292–3302.