MROX 2.0: a software tool to explore quantum heterostructures by combining X-ray reflectivity and diffraction-Reference-Cited by-同舟云学术

MROX 2.0: a software tool to explore quantum heterostructures by combining X-ray reflectivity and diffraction

Published:2023 Issue:29 Volume:25 Page:4133-4145
ISSN:1466-8033
Container-title:CrystEngComm
language:en
Short-container-title:CrystEngComm

Author:

Magalhães S.¹^ORCID,Cachim C.²^ORCID,Correia P. D.²^ORCID,Oliveira F.³,Cerqueira F.³,Sajkowski J. M.⁴,Stachowicz M.⁴

Affiliation:

1. IPFN, Instituto de Plasmas e Fusão Nuclear, Campus Tecnológico e Nuclear, Instituto Superior Técnico, Universidade de Lisboa, Estrada Nacional 10, 2695-066 Bobadela LRS, Portugal

2. Instituto Superior Técnico, Universidade de Lisboa, Avenida Rovisco Pais 1, 1049-001 Lisboa, Portugal

3. Centro de Física, Universidade do Minho, Campus de Gualtar, 4710-057 Braga, Portugal

4. Institute of Physics of the Polish Academy of Sciences, Al. Lotników 32/46, PL-02-668, Warsaw, Poland

Abstract

New software for the fitting of XRR measurements is developed. It is exemplified on 1 to 10 Si/Ge periods grown on Si template samples and on (001) substrates and one complex ZnO/Zn1−xMgxO superlattice grown on a m-ZnO substrate.

Funder

Fundação para a Ciência e a Tecnologia

Publisher

Royal Society of Chemistry (RSC)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2023/CE/D3CE00371J

Reference67 articles.

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