Characterization and simulation of 280 nm UV-LED degradation-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Characterization and simulation of 280 nm UV-LED degradation

Published:2021-03-01 Issue:3 Volume:11 Page:035315
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Su Mengwei¹,Zhu Xinglin¹,Guo Qi¹,Chen Zhiqiang¹,Deng Shaodong¹,Chen Ziqian¹,Wang Yukun¹^ORCID,Deng Jianyu¹,Sun Wenhong¹²^ORCID

Affiliation:

1. Research Center for Optoelectronic Materials and Devices, School of Physical Science and Technology, Guangxi University, Nanning 530004, China

2. Guangxi Key Laboratory of Processing for Non-ferrous Metal and Featured Materials, Guangxi University, Nanning 530004, China

Funder

Bagui Talent of Guangxi Province

Talent Model Base

Guangxi Science and Technology Program

Guangxi Science and Technology Base and Talent Special Project

Guangxi University Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0040008

Reference31 articles.

1. Development and future of ultraviolet light-emitting diodes: UV-LED will replace the UV lamp

2. Performance Improvement of AlN Crystal Quality Grown on Patterned Si(111) Substrate for Deep UV-LED Applications

3. Development of highly durable deep-ultraviolet AlGaN-based LED multichip array with hemispherical encapsulated structures using a selected resin through a detailed feasibility study

4. Degradation of (In)AlGaN-Based UVB LEDs and Migration of Hydrogen

5. Optical power degradation mechanisms in AlGaN-based 280nm deep ultraviolet light-emitting diodes on sapphire

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study on the Degradation Performance of AlGaN-Based Deep Ultraviolet LEDs under Thermal and Electrical Stress;Coatings;2024-07-19

2. Defect Behavior on the Degradation of AlGaN-Based 234 nm LEDs;IEEE Transactions on Electron Devices;2024-02

3. Review—Reliability and Degradation Mechanisms of Deep UV AlGaN LEDs;ECS Journal of Solid State Science and Technology;2023-05-31

4. Trap Behavior of the Optical Power Fluctuation in AlGaN-Based UV-C LEDs Degradation;IEEE Transactions on Electron Devices;2023-02

5. Deep UV AlGaN LED reliability for long duration space missions;Journal of Vacuum Science & Technology A;2023-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3