Diffuse x-ray scattering of misfit dislocations at Si1−xGex/Si interfaces by triple crystal diffractometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.365885
Reference23 articles.
1. Misfit dislocation structure at a Si/SixGe1−xstrained‐layer interface
2. Misfit strain relaxation in GexSi1−x/Si heterostructures: The structural stability of buried strained layers and strained‐layer superlattices
3. Effect of thermal annealing on the Raman spectrum of Si1−xGexgrown on Si
4. Molecular beam epitaxy of strained Si1−xGex layers on patterned substrates
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