Probing the transition layer at the SiO2‐Si interface using core level photoemission
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.94565
Reference19 articles.
1. Properties of the silicon–SiO2 interface
2. Properties of the silicon–SiO2 interface
3. Morphology and electronic structure of Si–SiO2 interfaces and Si surfaces
4. Atomic structure at the (111) Si‐SiO2interface
5. High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous SiO2and the Si-SiO2Interface
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