High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous SiO2and the Si-SiO2Interface-Reference-Cited by-同舟云学术

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High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous SiO2and the Si-SiO2Interface

Published:1979-11-26 Issue:22 Volume:43 Page:1683-1686
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Grunthaner F. J.,Grunthaner P. J.,Vasquez R. P.,Lewis B. F.,Maserjian J.,Madhukar A.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.43.1683/fulltext

Reference11 articles.

1. The structure of vitreous silica: Validity of the random network theory

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