SiO2/Si(100) interface studied by Al Kα x‐ray and synchrotron radiation photoelectron spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.110279
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5. Vibrationally resolved core-level photoelectron spectroscopy: Si 2plevels ofSiH4andSiF4molecules
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