Total reflection x‐ray excited photoelectron spectra of copper phthalocyanine thin layer on Si wafer
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.115307
Reference20 articles.
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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4. Surface studies of solids using integral X-ray-induced photoemission yield;Scientific Reports;2016-11-22
5. Self-detection of x-ray Fresnel transmissivity using photoelectron-induced gas ionization;Applied Physics Letters;2016-01-25
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