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Thin film structural analysis using variable-period x-ray standing waves

Published:2018-10-01 Issue:16 Volume:98 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Gibson Joshua S.,Syres Karen L.,Buckley Matthew,Lee Tien-Lin,Thakur Pardeep K.,Jones Robert G.

Funder

Engineering and Physical Sciences Research Council

Diamond Light Source

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.98.165402/fulltext

Reference51 articles.

1. In situspectroscopic ellipsometry as a versatile tool for studying atomic layer deposition

2. Spectroscopic ellipsometry — Past, present, and future

3. Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives

4. Thin film and surface characterization by specular X-ray reflectivity

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1. X-ray irradiation-induced ligand cleavage of a phthalocyanine derivative, tin (IV) phthalocyanine dichloride: A potential for X-ray activation of caged compounds;Chemical Physics Letters;2023-07

2. Vertical position of Sr dopants in the SrxBi2Se3 superconductor;Physical Review B;2021-08-06

3. Insights from molecular dynamics simulations on structural organization and diffusive dynamics of an ionic liquid at solid and vacuum interfaces;Journal of Colloid and Interface Science;2019-10

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