Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives-Reference-Cited by-同舟云学术

Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives

Published:2009-06-12 Issue:7 Volume:11 Page:1521-1554
ISSN:1388-0764
Container-title:Journal of Nanoparticle Research
language:en
Short-container-title:J Nanopart Res

Author:

Losurdo Maria,Bergmair Michael,Bruno Giovanni,Cattelan Denis,Cobet Christoph,de Martino Antonello,Fleischer Karsten,Dohcevic-Mitrovic Zorana,Esser Norbert,Galliet Melanie,Gajic Rados,Hemzal Dušan,Hingerl Kurt,Humlicek Josef,Ossikovski Razvigor,Popovic Zoran V.,Saxl Ottilia

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science,Modeling and Simulation,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Link

https://link.springer.com/content/pdf/10.1007/s11051-009-9662-6.pdf

Reference99 articles.

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