Surface studies of solids using integral X-ray-induced photoemission yield
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep37440.pdf
Reference35 articles.
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3. Chester, M. J. & Jach, T. Grazing-incidence X-ray photoelectron spectroscopy from multilayer media: Oxidized GaAs (100) as a case study. Phys. Rev. B 48, 17262–17270 (1993).
4. Kawai, J. et al. Total reflection X-ray excited photoelectron spectra of copper phthalocyanine thin layer on Si wafer. Appl. Phys. Lett. 67, 3889–3891 (1995).
5. Hayashi, K. et al. Photoelectron spectra enhanced by X-ray total reflection and diffraction from periodic multilayer. Appl. Phys. Lett. 68, 1921–1923 (1996).
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