Synchrotron Radiation Experiments
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-19-7361-1_6
Reference87 articles.
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2. C.S. Fadley, R.J. Baird, W. Siekhaus, T. Novakov, S.Å.L. Bergström, Surface analysis and angular distributions in X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom. 4(2), 93–137 (1974). https://doi.org/10.1016/0368-2048(74)90001-2
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4. M. Mehta, C.S. Fadley, Enhancement of surface-atom intensities in X-ray photoelectron spectra at low X-ray incidence angles. Phys. Lett. A 55(1), 59–61 (1975). https://doi.org/10.1016/0375-9601(75)90394-1
5. M. Mehta, C.S. Fadley, Angular-dependent X-ray photoemission study of oxidized silicon at low X-ray incidence angles. Chem. Phys. Lett. 46(2), 225–230 (1977). https://doi.org/10.1016/0009-2614(77)85248-2
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