Investigation of optical properties of interfaces between heavily doped Al0.48In0.52As:Si and InP (Fe) substrates by photoreflectance analysis
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.370329
Reference26 articles.
1. Composition dependence of band gap and type of lineup in In1−x−yGaxAlyAs/InP heterostructures
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3. Growth and characterization of type-II/type-I AlGaInAs/InP interfaces
4. Material for future InP-based optoelectronics: InGaAsP versus InGaAlAs
5. Growth of high quality AlInAs by low pressure organometallic chemical vapor deposition for high speed and optoelectronic device applications
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1. Carriers’ localization and thermal redistribution in InAlAs/InP grown by MOCVD on (311)A- and (311)B-InP substrates;Applied Physics A;2019-01-29
2. Contactless electroreflectance study of the surface potential barrier in n-type and p-type InAlAs van Hoof structures lattice matched to InP;Journal of Physics D: Applied Physics;2018-05-04
3. Effect of piezoelectric field on type II transition in InAlAs/InP (311) alloys with different substrate polarity;Journal of Alloys and Compounds;2018-03
4. Photoluminescence study of interfaces between heavily doped Al0.48In0.52As:Si layers and InP (Fe) substrates;Journal of Applied Physics;2002-06
5. Band parameters for III–V compound semiconductors and their alloys;Journal of Applied Physics;2001-06
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