Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2957468
Reference7 articles.
1. Band alignments and photon-induced carrier transfer from wetting layers to Ge islands grown on Si(001)
2. Minority carrier lifetime and iron concentration measurements on p-Si wafers by infrared photothermal radiometry and microwave photoconductance decay
3. Easy-to-use surface passivation technique for bulk carrier lifetime measurements on silicon wafers
4. Kelvin probe force microscopy
5. Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
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