Minority carrier lifetime and iron concentration measurements on p-Si wafers by infrared photothermal radiometry and microwave photoconductance decay
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.373506
Reference12 articles.
1. Laser infrared photothermal radiometry of semiconductors: principles and applications to solid state electronics
2. Relative sensitivity of photomodulated reflectance and photothermal infrared radiometry to thermal and carrier plasma waves in semiconductors
3. Theoretical and experimental aspects of three-dimensional infrared photothermal radiometry of semiconductors
4. Computational Aspects of Laser Radiometric Multiparameter Fit for Carrier Transport Property Measurements in Si Wafers
5. Charge‐carrier kinetics in semiconductors by microwave conductivity measurements
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