Subsurface imaging of cavities in liquid by higher harmonic atomic force microscopy
Author:
Affiliation:
1. Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026, China
2. The 38th Research Institute of China Electronics Technology Group Corporation, Hefei 230088, China
Funder
Anhui Major Scientific Instruments Development Project
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5057884
Reference25 articles.
1. Nanoscale subsurface imaging
2. Visualizing the Subsurface of Soft Matter: Simultaneous Topographical Imaging, Depth Modulation, and Compositional Mapping with Triple Frequency Atomic Force Microscopy
3. Subsurface imaging of silicon nanowire circuits and iron oxide nanoparticles with sub-10 nm spatial resolution
4. Nanoscale Imaging of Buried Structures via Scanning Near-Field Ultrasound Holography
5. Ultrasound holography for noninvasive imaging of buried defects and interfaces for advanced interconnect architectures
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