Linearizing the frequency‐stiffness relation in contact resonance atomic force microscopy for facilitated mechanical characterization-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Linearizing the frequency‐stiffness relation in contact resonance atomic force microscopy for facilitated mechanical characterization

Published:2022-02-04 Issue:6 Volume:85 Page:2123-2130
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microscopy Res & Technique

Author:

Wang Wenting¹²,Zhang Wenhao¹²,Chen Yuhang¹²^ORCID

Affiliation:

1. Department of Precision Machinery and Precision Instrumentation University of Science and Technology of China Hefei China

2. Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes University of Science and Technology of China Hefei China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jemt.24070

Reference30 articles.

1. Magnetic Force Microscopy in Liquids

2. Ultimate Decoupling between Surface Topography and Material Functionality in Atomic Force Microscopy Using an Inner-Paddled Cantilever

3. Mapping heterogeneity of cellular mechanics by multi-harmonic atomic force microscopy

4. Nanometer-resolved quantification of mechanical response in nanoparticle-based composites

5. Measurement of Poisson’s ratio with contact-resonance atomic force microscopy

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP