SiLcore edge fine structure in an oxidation series of silicon compounds: A comparison of microelectron energy loss spectra with theory
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.335768
Reference29 articles.
1. Structural and Chemical Microanalysis of Oxygen-Bearing Precipitates in Silicon
2. The Intergranular Phase in Hot-Pressed Silicon Nitride: I, Elemental Composition
3. Nitrogen Ion Implantation in Silicon: Structure of the Subsurface Region
4. K-shell ionization cross-sections for use in microanalysis
5. Inelastic Collisions of Fast Charged Particles with Atoms: Ionization of the AluminumLShell
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