Bulk‐quality bipolar transistors fabricated in low‐temperature (Tdep=800 °C) epitaxial silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.97850
Reference4 articles.
1. Low‐temperature silicon epitaxy using low pressure chemical vapor deposition with and without plasma enhancement
2. Low‐temperature silicon epitaxy by ultrahigh vacuum/chemical vapor deposition
3. Bipolar transistor fabrication in low-temperature (745°C) ultra-low-pressure chemical-vapor-deposited epitaxial silicon
4. The effect of doping on the formation of swirl defects in dislocation-free czochralski-grown silicon crystals
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Electrical characterization of junctions and bipolar transistors formed with in situ doped low-temperature (800 degrees C) epitaxial silicon;IEEE Transactions on Electron Devices;1991
2. Etching Selectivity of SiF4 and H2 Plasmas for c-Si, a-Si:H and SiO2;MRS Proceedings;1990
3. Chemical Vapor Deposition of Epitaxial Silicon from Silane at Low Temperatures: I . Very Low Pressure Deposition;Journal of The Electrochemical Society;1989-08-01
4. Fabrication and characterization of bipolar transistors with in-situ doped low-temperature (800 degrees C) epitaxial silicon;IEEE Electron Device Letters;1989-08
5. Formation of low‐temperature Al/n‐Si Schottky contacts using a partially ionized beam deposition technique;Applied Physics Letters;1988-09-05
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