Electron‐spin‐resonance study of radiation‐induced paramagnetic defects in oxides grown on (100) silicon substrates
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.341494
Reference46 articles.
1. THE EFFECT OF LOW‐ENERGY ELECTRON IRRADIATION OF METAL‐OXIDE‐SEMICONDUCTOR STRUCTURES
2. Vacuum Ultraviolet Radiation Effects in SiO2
3. Comparison of interface‐state buildup in MOS capacitors subjected to penetrating and nonpenetrating radiation
4. Two‐stage process for buildup of radiation‐induced interface states
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