Dislocation reduction in GaN grown on stripe patterned r-plane sapphire substrates

Author:

Chen Hou-Guang,Ko Tsung-Shine,Ling Shih-Chun,Lu Tien-Chang,Kuo Hao-Chung,Wang Shing-Chung,Wu Yue-Han,Chang Li

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 35 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Analysis of Wet-Etched Structures on R-Plane Substrates of Sapphire in the Etchant of Sulfuric Acid and Phosphoric Acid;ECS Journal of Solid State Science and Technology;2024-04-01

2. Quality Evaluation of Single-Crystal Wafer X-Ray Detection Using Random Vector Functional-Link Network;IEEE Transactions on Instrumentation and Measurement;2023

3. Research on thermal stress and trapping level of green mini LED;International Conference on Optoelectronic Materials and Devices (ICOMD 2021);2022-02-16

4. Patterned sapphire substrates cause a wavelength shift of green InGaN light-emitting diodes;Optical Materials Express;2020-08-03

5. An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument;IEEE Transactions on Instrumentation and Measurement;2019-10

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