Quality Evaluation of Single-Crystal Wafer X-Ray Detection Using Random Vector Functional-Link Network
Author:
Affiliation:
1. College of Information Science and Engineering, Northeastern University, Shenyang, China
Funder
National Natural Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/10012124/10262040.pdf?arnumber=10262040
Reference37 articles.
1. An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument
2. High-efficiency InGaN-based LEDs grown on patterned sapphire substrates using nanoimprinting technology
3. Precise orientation of single crystals by a simple x-ray diffraction rocking curve method
4. A Comprehensive Evaluation Model of Network Information Security Based on Interval-Valued Fuzzy Mathematics
5. Evaluation of DC Power Quality Based on Empirical Mode Decomposition and One-Dimensional Convolutional Neural Network
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